System-on-Chip Test Architectures Books

Click Get Book Button To Download or read online System-on-Chip Test Architectures books, Available in PDF, ePub, Tuebl and Kindle. This site is like a library, Use search box in the widget to get ebook that you want.

System on Chip Test Architectures


System on Chip Test Architectures
  • Author : Laung-Terng Wang
  • Publisher : Morgan Kaufmann
  • Release : 2010-07-28
  • ISBN : 0080556809
  • Language : En, Es, Fr & De
GET BOOK

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

VLSI Test Principles and Architectures


VLSI Test Principles and Architectures
  • Author : Laung-Terng Wang
  • Publisher : Elsevier
  • Release : 2006-08-14
  • ISBN : 0080474799
  • Language : En, Es, Fr & De
GET BOOK

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

System on Chip for Real Time Applications


System on Chip for Real Time Applications
  • Author : Wael Badawy
  • Publisher : Springer Science & Business Media
  • Release : 2002-10-31
  • ISBN : 1402072546
  • Language : En, Es, Fr & De
GET BOOK

System-on-Chip for Real-Time Applications will be of interest to engineers, both in industry and academia, working in the area of SoC VLSI design and application. It will also be useful to graduate and undergraduate students in electrical and computer engineering and computer science. A selected set of papers from the 2nd International Workshop on Real-Time Applications were used to form the basis of this book. It is organized into the following chapters: -Introduction; -Design Reuse; -Modeling; -Architecture; -Design Techniques; -Memory; -Circuits; -Low Power; -Interconnect and Technology; -MEMS. System-on-Chip for Real-Time Applications contains many signal processing applications and will be of particular interest to those working in that community.

Design and Test Technology for Dependable Systems on chip


Design and Test Technology for Dependable Systems on chip
  • Author : Raimund Ubar
  • Publisher : IGI Global
  • Release : 2011-01-01
  • ISBN : 9781609602147
  • Language : En, Es, Fr & De
GET BOOK

"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

Introduction to Advanced System on Chip Test Design and Optimization


Introduction to Advanced System on Chip Test Design and Optimization
  • Author : Erik Larsson
  • Publisher : Springer Science & Business Media
  • Release : 2005-11-07
  • ISBN : 1402032072
  • Language : En, Es, Fr & De
GET BOOK

SOC test design and its optimization is the topic of this book, and the aim is to give an introduction to testing, describe the problems related to SOC testing, discuses the modeling granularity and the implementation into EDA (electronic design automation) tools. It first introduces readers to test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. Then it discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. The final part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with core selection process. Intended for graduate students and PhD-students working in the test field, the manual also aids researchers and professors who would like to get into the area of SOC testing.