Thermal Management of Gallium Nitride Electronics Books

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Characterization of Devices and Materials for Gallium Nitride and Diamond Thermal Management Applications


Characterization of Devices and Materials for Gallium Nitride and Diamond Thermal Management Applications
  • Author : Bobby Logan Hancock
  • Publisher :
  • Release : 2016
  • ISBN : OCLC:1018473593
  • Language : En, Es, Fr & De
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As trends progress toward higher power applications in GaN-based electronic and photonic devices, the issue of self-heating becomes a prominent concern. This is especially the case for high-brightness light-emitting diodes (LEDs) and high electron mobility transistors (HEMTs), where the bulk of power dissipation occurs within a small (sub-micron) region resulting in highly localized temperature rises during operation. Monitoring these thermal effects becomes critical as they significantly affect performance, reliability, and overall device lifetime. In response to these issues, diamond grown by chemical vapor deposition (CVD) has emerged as a promising material in III-nitride thermal management as a heat-spreading substrate due to its exceptional thermal conductivity. This work is aimed toward the characterization of self-heating and thermal management technologies in GaN electronic and photonic devices and their materials. The two main components of this dissertation include assessing self-heating in these devices through direct measurement of temperature rises in high-power LEDs and GaN HEMTs and qualifying thermal management approaches through the characterization of thermal conductivity and material quality in CVD diamond and its incorporation into GaN device layers. The purpose of this work is to further the understanding of thermal effects in III-nitride materials as well as provide useful contributions to the development of future thermal management technologies in GaN device applications.

Device level Thermal Analysis of Gallium Nitride based Electronics


Device level Thermal Analysis of Gallium Nitride based Electronics
  • Author : Kevin Robert Bagnall
  • Publisher :
  • Release : 2013
  • ISBN : OCLC:858862774
  • Language : En, Es, Fr & De
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Gallium nitride (GaN)-based microelectronics are one of the most exciting semiconductor technologies for high power density and high frequency electronics. The excellent electrical properties of GaN and its related alloys (high critical electric field, carrier concentration, and carrier mobility) have enabled record-breaking performance of GaN-based high electron mobility transistors (HEMTs) for radio-frequency (RF) applications. However, the very high power density in the active region of GaN HEMTs leads to significant degradation in performance as the device temperature increases. Thus, effective thermal management of GaN-based electronics is a key to enabling the technology to reach its full potential. Despite the vast amount of research into thermal issues in GaN-based electronics, including both modeling and experimental studies, there are a number of poorly understood issues. For instance, the heat source distribution in GaN HEMTs for RF applications has not been quantified nor have metrics been published for the heat flux in the near-junction region. Often, device engineers neglect the importance of thermal boundary conditions, which play a major role in shaping the temperature distribution in the device. Temperature rise in GaN HEMTs is typically modeled using computationally expensive numerical methods; analytical methods that are more computationally efficient are often quite limited. In this thesis, a literature review is given that discusses previous research in thermal issues in GaN-based electronics and that provides a perspective on the important factors to consider for thermal management. Electro-thermal modeling tools validated with test devices were used to derive quantitative information about the heat source distribution in GaN HEMTs. Both numerical and analytical thermal models were developed that provide helpful insight into the dominant factors in the formation of highly localized hotspots in the near-junction region. The Kirchhoff transformation, a technique for solving the heat conduction equation for situations in which the thermal conductivity of a material depends on temperature, was extended and applied to GaN HEMTs. The research described in this thesis provides critical information in understanding thermal issues in GaN-based electronics required to develop next generation near-junction thermal management technologies.

Gallium Nitride Electronics


Gallium Nitride Electronics
  • Author : Rüdiger Quay
  • Publisher : Springer Science & Business Media
  • Release : 2008-04-05
  • ISBN : 3540718923
  • Language : En, Es, Fr & De
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This book is based on nearly a decade of materials and electronics research at the leading research institution on the nitride topic in Europe. It is a comprehensive monograph and tutorial that will be of interest to graduate students of electrical engineering, communication engineering, and physics; to materials, device, and circuit engineers in research and industry; to all scientists with a general interest in advanced electronics.

Aspencore Guide to Gallium Nitride


Aspencore Guide to Gallium Nitride
  • Author : Maurizio Di Paolo Emilio
  • Publisher :
  • Release : 2021-01-20
  • ISBN : 1735813125
  • Language : En, Es, Fr & De
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As silicon reaches its theoretical performance limits for power electronics, industry is shifting toward wide-bandgap materials like Gallium Nitride (GaN), whose properties provide clear benefits in power converters for consumer and industrial electronics. In over 150 pages covering the technology, its applications, markets and future potential, this book delves into GaN technology and its importance for power electronics professionals engaged with its implementation in power devices. The properties of GaN, such as low leakage current, significantly reduced power losses, higher power density and the ability to tolerate higher operating temperatures, all from a device smaller than its silicon-only equivalent, provide design advantages allowing previously unimaginable application performance. As an alternative to silicon, GaN can provide clear benefits in power converters for consumer and industrial electronics; chargers for wireless devices, including 5G; driver circuits for motor control; and power switches in automotive and space applications.The book also explores why GaN-based devices hold the key to addressing the energy efficiency agenda, a key strategic initiative in increasingly power-reliant industries such as data centers, electric vehicles, and renewable energy systems. Highly efficient residential and commercial energy storage systems using GaN technology will enable distribution, local storage, and on-demand access to renewable energy. Continued progress in the battery market will lead to declining battery costs and the development of smaller batteries that pair with GaN technology-based converters and inverters. Thermal management is critical in power electronics, and high efficiency in higher-power systems is always a focus. With GaN, a 50% reduction in losses can be achieved, reducing the costs and area required to manage heat. The book delves into GaN's electrical characteristics and how these can be exploited in power devices. There are also chapters that cross into the key applications for GaN devices for several markets such as space, automotive, audio, motor control and data centers. Each chapter provides a comprehensive overview of the subject matter for anyone who wants to stay on the leading edge of power electronics.

Power Electronics Thermal Management R D


Power Electronics Thermal Management R   D
  • Author :
  • Publisher :
  • Release : 2016
  • ISBN : OCLC:951617837
  • Language : En, Es, Fr & De
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The objective for this project is to develop thermal management strategies to enable efficient and high-temperature wide-bandgap (WBG)-based power electronic systems (e.g., emerging inverter and DC-DC converter). Device- and system-level thermal analyses are conducted to determine the thermal limitations of current automotive power modules under elevated device temperature conditions. Additionally, novel cooling concepts and material selection will be evaluated to enable high-temperature silicon and WBG devices in power electronics components. WBG devices (silicon carbide [sic], gallium nitride [GaN]) promise to increase efficiency, but will be driven as hard as possible. This creates challenges for thermal management and reliability.